X-ray diffraction is the investigative use of X-rays to discoverthe internal structure of a number of different things. The basicapproach is to set up a target material and direct a beam of X-raysat it. By looking at the pattern of the scattered X-rays noting thescattering angles and their relative intensities, observers cancome to informed conclusions about the internal structure of thattarget material. It must be noted that the manner in which X-raysscatter can vary a good deal, and X-ray diffraction technology hasbecome a broad field with diverging and complex investigativetechniques. Even so, the fundamentals remain the same.